Introduction
Thanks to the advanced technology, flash and DRAM devices feature high endurance and reliable performance, making them useful for a wide range of applications, from industry, where long operating hours are required, to the military, where shocks and vibrations are regular occurrences, to vehicles where stability is a must, to the IoT, where ruggedness benefits users worldwide. To ensure that products have a long lifespan and low maintenance costs, wide temperature technology has become a bedrock feature of many devices.
Wide temperature technology allows devices to deliver stable, reliable performance under extreme temperatures. Devices that have passed wide temperature testing can operate in temperatures ranging from -40℃ to 85℃. Transcend’s products for embedded solutions are fully tested to run efficiently in this temperature range.
The testing is conducted in an exclusively-designed chamber. Inside this chamber, flash and DRAM modules undergo swift and extreme temperature change for a certain period of time. The endurance status of each item will be indicated by signals, and further inspection is carried out for unqualified items.
Transcend strictly follows JESD218A standard published by JEDEC to comply with the endurance requirements of different drive class. To meet SSD endurance and reliability ratings, the drives are tested for several criteria for defined workloads and use temperatures. JEDEC evaluates reliability by calculating the Unrecoverable Bit Error Per Ratio (UBER)1 and measures endurance by calculating the Functional Failure Requirement (FFR)2. Both of these variables are figures that quantify the failures, or errors, occurred in a specific operating environment.
| Class |
Power on |
Power off |
FFR |
UBER |
| Client |
40℃
8 hrs/day |
30℃
1 year |
≦3% |
≦10-15 |
| Enterprise |
55℃
24hrs/day |
40℃
3 months |
≦3% |
≦10-16 |
Table 1- SSD Classes and Requirements Source: JESD218A
Transcend employs real-world client-class workload and use temperatures to verify the endurance and data retention capabilities of its drives. By referring to the tested figures, enterprise users, in manufacturing, Internet of Vehicle, system automation, military, and healthcare, can understand at a glance how long their data can be expected to be retained when storage devices are operated under certain conditions. Extended lifespan and optimized performance are guaranteed for memory products incorporated with wide temperature technology. With this solution, sturdy devices are expected to boost business growth and sustainability.
Transcend implements wide temperature technology in industrial products like SSDs, SD cards, and DRAM memory modules in a variety of storage capacities and form factors. By providing robust products for our customers, Transcend offers guaranteed quality for its products for embedded applications. For more wide temperature products, please visit our Embedded Solutions page.
- 1. Uncorrectable Bit Error Per Rate (UBER): A metric for the rate of occurrence of data errors, equal to the number of data errors per bit read.
- 2. Functional Failure Requirement (FFR): The allowed cumulative functional failures over the TBW rating.
- 3. Temperature range may vary by product. Please refer to our product webpage for more details.